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Department of Electronics
Integrated Wireless Communication Systems
Equipment and Tools
- RF Network Measurements - 300 kHz to 50 GHz
- Nonlinear Network Measurements (up to 5th order) - 1 Hz to 10 MHz
- Semiconductor Parameter Analysers - HP4145
- On-wafer device probing - Cascade probe station with thermal stage
- Access to Large-Signal Nonlinear Network Measurements - to 110 GHz
Software Tools
- Complete set of Cadence Design tools for digital and analog microelectronics
- Complete set of Mentor Graphics IC nanometer design tools
- Microwave Office
- ADS
- Networked automation of measurements with advanced scripting
- SPICE
Workshop Facilities
- Fabrication of microwave and surface-mount circuits
- Mechanical component fabrication
