Arbitrary Pulsed Semiconductor Parameter Analyzer
Typical Specifications
Device MeasurementA 2000-point set of isothermal device characteristics can be measured in under three seconds.
| Specification | APSPA | ||
|---|---|---|---|
| Quiescent stimulus | |||
| Voltage range | ±20 V | ||
| Resolution | 12 to 16 bits | ||
| Current range(1) | ±500 mA | ||
| Pulse amplitude specifications | |||
| Voltage range (open circuit) | ±20 V | ||
| Output resistance | 0.25 - 50 ohm | ||
| Pulse amplitude resolution | 12 bits | ||
| Maximum peak current (<3ms) | 3 A | ||
| Pulse timing specifications | |||
| Minimum pulse width | 100 ns | ||
| Maximum pulse width | 25 s | ||
| Maximum pulse period | 25 s | ||
| Event timing resolution | ~ 12 ns | ||
| Digitiser Specifications | |||
| Current range | ±5 mA to ±1 A | ||
| Resolution | 12 bits | ||
| Accuracy | 2 % | ||
| Measurement time (2) | |||
| Software & operating system overhead | ~ 2 s | ||
| Download & storage time | ~1 ms/meas. point | ||
| Typical measurement time for 2000-points with 100-fold averaging and 0.1% duty cycle | 3 s | ||
| Software Features | |||
| Command-line Operation | yes | ||
| Grid (start/stop/step) voltage selection | yes | ||
| User list of points | yes | ||
| Maximum number of measurement points (4) | 8000 | ||
| Cable length compensation, timing calibration | yes | ||
| Background soak tests | yes | ||
| Pseudo-random sequencing | gate only | ||
| Script file command execution | yes | ||
| Command line parameter override | yes | ||
| Soft compliance limiting | yes | ||
| Linear time-domain pulse profiling | yes | ||
| Log time-domain pulse profiling | yes | ||
| S-parameters with HP85108 system | yes |
1 ±400 mA with option 1446.
2 Minimum theoretical time is determined by pulse width, duty cycle, number of points, and averaging factor.
3 There is a 2s overhead each time the high-power pulser voltages are changed. The APSPA minimizes the number of times this occurs.
4 Limited by available memory.