Arbitrary Pulsed Semiconductor Parameter Analyzer
The arbitrary pulsed semiconductor parameter analyser system (APSPA) implements fast, accurate Pulsed-I(V) testing of microwave transistors, MMICs, and MOSFETs. The APSPA system has been developed for rapid and flexible measurements. The system architecture allows measurement in theoretical minimum time (often faster than an equivalent dc instrument). This makes the system an ideal choice for production line testing.Use can be made of APSPA through measurement services offered by CNERF or by setting up an instrument with the software that is licensed through Macquarie Research Ltd.
When configured with an HP85108 test system, the APSPA can make pulsed S-parameter measurements.
To gain some insight into the operation of the instrument, download
a PDF version copy of an older version APSPA user manual.
APSPA User Manual (man.pdf)
Download a demo version of APSPA version 2.0 software. This is an
almost fully functional version that operates as a virtual
instrument measuring a MESFET. Requires Win95/NT.
APSPA Demo Software (apspad.zip)
Instrument Format
The APSPA system is built up from modular off-the-shelf subsections. These can include VXI, PCI and stand-alone instruments, which are controlled by a PC.Sophisticated floating rail current sensors and bias networks are available for accurate measurements up 20 volts and 1 amp at 100ns to 100s pulse widths.
Contact CNERF for more information and customized requirements.
Applications
Flexibility has been designed into the APSPA system to provide many other unique measurement modes, including bias dependence and time-domain. Characteristics can be measured about different quiescient bias points, exposing thermal and charge dependencies.Control of Pulse Timing
The system's wide range of timing intervals and arbitrary measurement sequencing permits an unprecedented ability to see what is going on in the measurement.| Conventional DC characteristics look good but can be misleading. |
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| Using the APSPA's abitrary sequencing while performing a conventional DC measurement exposes timing problems. |
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| High-speed pulsed measurement with the APSPA system gives true RF characteristics. |
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